TY  - RPRT
TI  - Double sided measurements and associated error bars for planar samples or subassemblies
AU  - Nikroo, Abbas
AU  - Kumar, Chuck
AU  - Schiaffino, Stefano
AU  - Hackbarth, Jason
AU  - Mcnaney, James
AU  - Riddles, Jacob
AU  - Eggert, Jon
AU  - Wilson, Mike
PY  - 2023
DO  - 10.2172/1999466
UR  - https://www.osti.gov/biblio/1999466
ID  - 1999466
ER  -