TY  - RPRT
TI  - Machine Learning-Enabled Quantitative Analysis of Optically Obscure Scratches on Nickel-Plated Additively Manufactured (AM) Samples
AU  - Mengesha, Betelhiem N.
AU  - Grizzle, Andrew C.
AU  - Demisse, Wondwosen
AU  - Klein, Kate L. (ORCID:0009000888344081)
AU  - Elliott, Amy (ORCID:0000000345754730)
AU  - Tyagi, Pawan (ORCID:0000000275411344)
PY  - 2023
DO  - 10.3390/ma16186301
UR  - https://www.osti.gov/biblio/2001346
ID  - 2001346
ER  -