@misc{indiciae7846e22014be,
  title = {Interface Trap Density Characterization of ALD Gate Dielectrics for GaN Power MOSFETs.},
  author = {Glaser, Caleb and Rummel, Brian and Binder, Andrew and Yates, Luke and Allerman, Andrew and Feezell, Daniel and Kaplar, Robert},
  year = {2022},
  doi = {10.2172/2003786},
  url = {https://www.osti.gov/biblio/2003786},
  note = {Source identifier: 2003786}
}