@misc{indiciaecce7549dfbc9,
  title = {SRAM Multi-Cell Upset Vulnerability at the 5-nm FinFET Node.},
  author = {Pieper, Nicholas and Xiong, Yoni and Feeley, Alexandra and Pasternak, John and Dodds, Nathaniel and Ball, Dennis and Bharat, Bhuva},
  year = {2022},
  url = {https://www.osti.gov/biblio/2004056},
  note = {Source identifier: 2004056}
}