TY  - RPRT
TI  - Ionization and displacement damage effects in high voltage vertical GaN diodes.
AU  - Vizkelethy, Gyorgy
AU  - Wampler, William
AU  - Armstrong, Andrew
AU  - Pickrell, Gregory
AU  - Gunning, B. P
AU  - Kropka, Kimberly
PY  - 2022
DO  - 10.2172/2004391
UR  - https://www.osti.gov/biblio/2004391
ID  - 2004391
ER  -