TY  - RPRT
TI  - Reliability of GaN power devices: Current status and Future challenges.
AU  - Aktas, Ozgur
AU  - Pickrell, Gregory
AU  - Kaplar, Robert
PY  - 2022
DO  - 10.2172/2004468
UR  - https://www.osti.gov/biblio/2004468
ID  - 2004468
ER  -