TY  - RPRT
TI  - Wide-Bandgap Power Electronics Reliability: Device Physics to Converter Performance.
AU  - Kaplar, Robert
AU  - DasGupta, Sandeepan
AU  - Mueller, Jacob
AU  - Garcia Rodriguez, Luciano
AU  - Flicker, Jack
AU  - Palacios, Fabian
AU  - Gill, Lee
AU  - Binder, Andrew
AU  - Atcitty, Stanley
PY  - 2022
UR  - https://www.osti.gov/biblio/2004868
ID  - 2004868
ER  -