@misc{indiciae7935521bdffe,
  title = {Deep Learning Based Workflow for Accelerated Industrial X-Ray Computed Tomography},
  author = {Rahman, Obaid and Venkatakrishnan, Singanallur and Scime, Luke and Brackman, Paul and Frederick, Curtis and Dehoff, Ryan and Paquit, Vincent and Ziabari, Amir},
  year = {2023},
  doi = {10.1109/icip49359.2023.10223192},
  url = {https://www.osti.gov/biblio/2007702},
  note = {Source identifier: 2007702}
}