TY  - RPRT
TI  - Submicrometer Single Crystal Diffractometry for Highly Accurate Structure Determination
AU  - Yasuda, Nobuhiro
AU  - Fukuyama, Yoshimitsu
AU  - Kimura, Shigeru
AU  - Toriumi, Koshiro
AU  - Takata, Masaki
PY  - 2010
DO  - 10.1063/1.3463161
UR  - https://www.osti.gov/biblio/21410217
ID  - 21410217
ER  -