TY  - RPRT
TI  - An Improved Method for Determining the Thermal Conductivity of supported nanomaterials using the Optothermal Raman Technique and uses for Stress-Strain dependence Measurements
AU  - Vallin, Micah Peter
AU  - Zhang, Richard
AU  - Pettes, Michael Thompson
PY  - 2023
UR  - https://www.osti.gov/biblio/2204177
ID  - 2204177
ER  -