@misc{indiciae22040fe1d6fc,
  title = {Sensitivity in X-ray grating interferometry on compact systems},
  author = {Thuering, Thomas and Modregger, Peter and Haemmerle, Stefan and Weiss, Stephan and Nueesch, Joachim and Stampanoni, Marco},
  year = {2012},
  doi = {10.1063/1.4742307},
  url = {https://www.osti.gov/biblio/22069174},
  note = {Source identifier: 22069174}
}