TY  - RPRT
TI  - Sensitivity in X-ray grating interferometry on compact systems
AU  - Thuering, Thomas
AU  - Modregger, Peter
AU  - Haemmerle, Stefan
AU  - Weiss, Stephan
AU  - Nueesch, Joachim
AU  - Stampanoni, Marco
PY  - 2012
DO  - 10.1063/1.4742307
UR  - https://www.osti.gov/biblio/22069174
ID  - 22069174
ER  -