@misc{indiciae13b8377d4d3f,
  title = {LANL Trace Element Analysis: ICP-MS and ICP-OES Methods [Slides]},
  author = {Bartlett, Joshua and Schappert, Michael Francis and Rearick, Michael Sean and Hubley, Nicholas Thomas},
  year = {2023},
  doi = {10.2172/2222604},
  url = {https://www.osti.gov/biblio/2222604},
  note = {Source identifier: 2222604}
}