@misc{indiciae6cf1924d672a,
  title = {Improved strain precision with high spatial resolution using nanobeam precession electron diffraction},
  author = {Rouviere, Jean-Luc and Martin, Yannick and Béché, Armand and Denneulin, Thibaud and Cooper, David},
  year = {2013},
  doi = {10.1063/1.4829154},
  url = {https://www.osti.gov/biblio/22253774},
  note = {Source identifier: 22253774}
}