TY  - RPRT
TI  - Improved strain precision with high spatial resolution using nanobeam precession electron diffraction
AU  - Rouviere, Jean-Luc
AU  - Martin, Yannick
AU  - Béché, Armand
AU  - Denneulin, Thibaud
AU  - Cooper, David
PY  - 2013
DO  - 10.1063/1.4829154
UR  - https://www.osti.gov/biblio/22253774
ID  - 22253774
ER  -