TY  - RPRT
TI  - Surface and material analytics based on Dresden-EBIS platform technology
AU  - Bischoff, L.
AU  - Pilz, W.
AU  - Zschornack, G.
PY  - 2015
DO  - 10.1063/1.4905403
UR  - https://www.osti.gov/biblio/22390857
ID  - 22390857
ER  -