TY  - RPRT
TI  - A versatile LabVIEW and field-programmable gate array-based scanning probe microscope for in operando electronic device characterization
AU  - Page, Michael R.
AU  - Young, Justin R.
AU  - Bhallamudi, Vidya P.
AU  - Johnston-Halperin, Ezekiel
AU  - Pelekhov, Denis V.
AU  - Hammel, P. Chris
AU  - Jacob, Jan
AU  - Lewis, Jim
AU  - Wenzel, Lothar
PY  - 2014
DO  - 10.1063/1.4902934
UR  - https://www.osti.gov/biblio/22392279
ID  - 22392279
ER  -