@misc{indiciaecc4868de842c,
  title = {Gate-control efficiency and interface state density evaluated from capacitance-frequency-temperature mapping for GaN-based metal-insulator-semiconductor devices},
  author = {Shih, Hong-An and Kudo, Masahiro and Suzuki, Toshi-kazu},
  year = {2014},
  doi = {10.1063/1.4901290},
  url = {https://www.osti.gov/biblio/22402640},
  note = {Source identifier: 22402640}
}