@misc{indiciae8b69ee3c461c,
  title = {Reconstruction of high-resolution atomic force microscopy measurements from fast-scan data using a Noise2Noise algorithm},
  author = {Natinsky, Eva (ORCID:0000000252139229) and Khan, Ryan M. (ORCID:0000000191945453) and Cullinan, Michael and Dingreville, Rémi (ORCID:000000031613695X)},
  year = {2024},
  doi = {10.1016/j.measurement.2024.114263},
  url = {https://www.osti.gov/biblio/2283787},
  note = {Source identifier: 2283787}
}