TY  - RPRT
TI  - Controllable diffraction pattern in semiconductor quantum well based on quantum coherence
AU  - Chen, Aixi
AU  - Zhang, Liujuan
AU  - Deng, Li
PY  - 2018
DO  - 10.1016/j.aop.2018.07.028
UR  - https://www.osti.gov/biblio/22848387
ID  - 22848387
ER  -