@misc{indiciae3df92c38e749,
  title = {Sources of error and methods to improve accuracy in interface state density analysis using quasi-static capacitance–voltage measurements in wide bandgap semiconductors},
  author = {Rummel, B. D. and Cooper, J. A. and Morisette, D. T. and Yates, L. and Glaser, C. E. and Binder, A. T. and Ramadoss, K. and Kaplar, R. J.},
  year = {2023},
  doi = {10.1063/5.0158333},
  url = {https://www.osti.gov/biblio/2311448},
  note = {Source identifier: 2311448}
}