TY  - RPRT
TI  - Sources of error and methods to improve accuracy in interface state density analysis using quasi-static capacitance–voltage measurements in wide bandgap semiconductors
AU  - Rummel, B. D.
AU  - Cooper, J. A.
AU  - Morisette, D. T.
AU  - Yates, L.
AU  - Glaser, C. E.
AU  - Binder, A. T.
AU  - Ramadoss, K.
AU  - Kaplar, R. J.
PY  - 2023
DO  - 10.1063/5.0158333
UR  - https://www.osti.gov/biblio/2311448
ID  - 2311448
ER  -