TY  - RPRT
TI  - First-principles residual resistivity using a locally self-consistent multiple scattering method
AU  - Raghuraman, Vishnu
AU  - Widom, Michael
AU  - Eisenbach, Markus
AU  - Wang, Yang
PY  - 2024
DO  - 10.1103/physrevb.109.104204
UR  - https://www.osti.gov/biblio/2326278
ID  - 2326278
ER  -