@misc{indiciaeb9b83c848d87,
  title = {Digital pixel test structures implemented in a 65 nm CMOS process},
  author = {Aglieri Rinella, Gianluca and Andronic, Anton (ORCID:0000000223726117) and Antonelli, Matias (ORCID:0000000334006710) and Aresti, Mauro (ORCID:0000000331426787) and Baccomi, Roberto and Becht, Pascal (ORCID:0000000279083288) and Beole, Stefania (ORCID:0000000346738038) and Braach, Justus (ORCID:0000000265792817) and Buckland, Matthew Daniel and Buschmann, Eric and Camerini, Paolo (ORCID:0000000292619497) and Carnesecchi, Francesca (ORCID:0000000199817536) and Cecconi, Leonardo and Charbon, Edoardo and Contin, Giacomo and Dannheim, Dominik (ORCID:0000000183257650) and de Melo, Joao and Deng, Wenjing (ORCID:0000000328609881) and di Mauro, Antonello (ORCID:000000030348092X) and Hasenbichler, Jan and Hillemanns, Hartmut and Hong, Geun Hee and Isakov, Artem (ORCID:000000022134967X) and Junique, Antoine and Kluge, Alex and Kotliarov, Artem (ORCID:0000000335764185) and Křížek, Filip and Lautner, Lukas (ORCID:0000000270174183) and Mager, Magnus and Marras, Davide and Martinengo, Paolo and Masciocchi, Silvia and Menzel, Marius Wilm and Munker, Magdalena and Piro, Francesco and Rachevski, Alexandre and Rebane, Karoliina and Reidt, Felix (ORCID:0000000252633593) and Russo, Roberto and Sanna, Isabella and Sarritzu, Valerio (ORCID:0000000198791119) and Senyukov, Serhiy (ORCID:0000000319079786) and Snoeys, Walter (ORCID:0000000335419066) and Sonneveld, Jory (ORCID:0000000183624414) and Šuljić, Miljenko (ORCID:0000000244901930) and Svihra, Peter (ORCID:0000000278112147) and Tiltmann, Nicolas (ORCID:0000000183613467) and Usai, Gianluca and Van Beelen, Jacob Bastiaan and Vassilev, Mirella Dimitrova (ORCID:0000000325178502) and Vernieri, Caterina and Villani, Anna (ORCID:0000000283243117)},
  year = {2023},
  doi = {10.1016/j.nima.2023.168589},
  url = {https://www.osti.gov/biblio/2327104},
  note = {Source identifier: 2327104}
}