TY  - RPRT
TI  - Optimizing exposure times of structured light metrology systems using a digital twin
AU  - Ojal, Nishant
AU  - Caviness, Alex (ORCID:0000000182920983)
AU  - Blum, Alexander
AU  - Au, Brian
AU  - Jaycox, Adam W.
AU  - Giera, Brian (ORCID:0000000165437498)
PY  - 2024
DO  - 10.1016/j.measurement.2023.113816
UR  - https://www.osti.gov/biblio/2328157
ID  - 2328157
ER  -