@misc{indiciaeced3be530bcd,
  title = {Testing Low-Loss Microstrip Materials with MKIDs for Microwave Applications},
  author = {Hood II, J. C. and Barry, P. S. and Cecil, T. and Chang, C. L. and Li, J. and Meyer, S. S. and Pan, Z. and Shirokoff, E. and Tang, A.},
  year = {2022},
  doi = {10.1007/s10909-022-02881-y},
  url = {https://www.osti.gov/biblio/2329399},
  note = {Source identifier: 2329399}
}