@misc{indiciae00ee8ad9ae38,
  title = {Detecting defects that reduce breakdown voltage using machine learning and optical profilometry},
  author = {Gallagher, James C. and Mastro, Michael A. and Jacobs, Alan G. and Kaplar, Robert. J. and Hobart, Karl D. and Anderson, Travis J.},
  year = {2024},
  doi = {10.1038/s41598-024-57875-5},
  url = {https://www.osti.gov/biblio/2329528},
  note = {Source identifier: 2329528}
}