TY  - RPRT
TI  - Degradation modeling and electrode engineering of SOFCs SOECs and R-SOCs
AU  - Abernathy, Harry
AU  - Epting, William
AU  - Lei, Yinkai
AU  - Liu, Jian
PY  - 2024
UR  - https://www.osti.gov/biblio/2342141
ID  - 2342141
ER  -