@misc{indiciae4cd6c8c17c24,
  title = {Crystalline Si Surface Passivation with Nafion for Bulk Defects Detection with Electron Paramagnetic Resonance},
  author = {Chen, Kejun and Johnston, Steve W. and Taylor, P. Craig and Mulder, David W. and Guthrey, Harvey L. and Nemeth, William and Theingi, San and Page, Matthew and Kaupa, Markus and Young, David L. and Agarwal, Sumit and Stradins, Paul},
  year = {2024},
  doi = {10.1021/acsami.4c03872},
  url = {https://www.osti.gov/biblio/2349501},
  note = {Source identifier: 2349501}
}