@misc{indiciaecb979a7e0e2f,
  title = {Simulating charged defects at database scale},
  author = {Shen, Jimmy-Xuan and Voss, Lars F. and Varley, Joel B.},
  year = {2024},
  doi = {10.1063/5.0203124},
  url = {https://www.osti.gov/biblio/2349589},
  note = {Source identifier: 2349589}
}