TY  - RPRT
TI  - Simulating charged defects at database scale
AU  - Shen, Jimmy-Xuan
AU  - Voss, Lars F.
AU  - Varley, Joel B.
PY  - 2024
DO  - 10.1063/5.0203124
UR  - https://www.osti.gov/biblio/2349589
ID  - 2349589
ER  -