TY  - RPRT
TI  - Development of a concurrent coupled Atomistic - Continuum model to predict the defect and grain structure for Additive Manufacturing process [Slides]
AU  - Chakraborty, Subhendu
AU  - Luscher, Darby Jon
AU  - Hunter, Abigail
PY  - 2022
DO  - 10.2172/2350611
UR  - https://www.osti.gov/biblio/2350611
ID  - 2350611
ER  -