TY  - RPRT
TI  - First-Principles Simulation of Beam-Induced Processes Underlying Atomic Manipulation in Electron Microscopes
AU  - Lingerfelt, David B.
AU  - Ganesh, Panchapakesan
AU  - Jakowski, Jacek
AU  - Sumpter, Bobby G.
PY  - 2024
DO  - 10.1021/accountsmr.4c00014
UR  - https://www.osti.gov/biblio/2351062
ID  - 2351062
ER  -