TY  - RPRT
TI  - In situ synchrotron X-ray diffraction analysis of ultrasonically assisted microstructure refinement during laser melting process
AU  - Wang, Tianzhao
AU  - Schneiderman, Benjamin
AU  - Clark, Samuel J.
AU  - Chuang, Andrew Chihpin
AU  - Yu, Zhenzhen
AU  - Liu, Xun
PY  - 2023
DO  - 10.1016/j.scriptamat.2023.115946
UR  - https://www.osti.gov/biblio/2368845
ID  - 2368845
ER  -