TY  - RPRT
TI  - High-speed X-ray study of process dynamics caused by surface features during continuous-wave laser polishing
AU  - Faue, Patrick
AU  - Rathmann, Lewin
AU  - Möller, Marius
AU  - Hassan, Mahmudul
AU  - Clark, Samuel J.
AU  - Fezzaa, Kamel
AU  - Klingbeil, Kevin
AU  - Richter, Brodan
AU  - Volpp, Joerg
AU  - Radel, Tim
AU  - Pfefferkorn, Frank E.
PY  - 2023
DO  - 10.1016/j.cirp.2023.04.026
UR  - https://www.osti.gov/biblio/2404557
ID  - 2404557
ER  -