@misc{indiciae64913ec7e6dd,
  title = {Grain Boundary Plane Measurement Using Transmission Electron Microscopy Automated Crystallographic Orientation Mapping for Atom Probe Tomography Specimens},
  author = {Hartshorne, Matthew and Leff, Asher and Vetterick, Gregory and Hopkins, Emily M. (ORCID:0000000196239689) and Taheri, Mitra L. (ORCID:0000000153491411)},
  year = {2023},
  doi = {10.1093/micmic/ozad022},
  url = {https://www.osti.gov/biblio/2419799},
  note = {Source identifier: 2419799}
}