TY  - RPRT
TI  - Formation of I 1 stacking fault by deformation defect evolution from grain boundaries in Mg
AU  - Hu, Yong-Jie
AU  - Menon, Vaidehi
AU  - Qi, Liang
PY  - 2022
DO  - 10.1016/j.jma.2022.07.010
UR  - https://www.osti.gov/biblio/2419829
ID  - 2419829
ER  -