@misc{indiciae862866fb60fa,
  title = {ToF-SIMS Depth Profiling to Measure Nanoparticle and Polymer Diffusion in Polymer Melts},
  author = {Wang, Kaitlin and Composto, Russell J. and Winey, Karen I.},
  year = {2023},
  doi = {10.1021/acs.macromol.3c00033},
  url = {https://www.osti.gov/biblio/2420509},
  note = {Source identifier: 2420509}
}