TY  - RPRT
TI  - Using lifetime of point defects for dislocation bias in bcc Fe
AU  - Hao, Jiannan
AU  - Casillas-Trujillo, Luis
AU  - Xu, Haixuan
PY  - 2022
DO  - 10.1016/j.cossms.2022.101021
UR  - https://www.osti.gov/biblio/2420993
ID  - 2420993
ER  -