TY  - RPRT
TI  - Determining the twist angle of stacked MoS 2 layers using machine learning-assisted low-frequency interlayer Raman fingerprints
AU  - Tang, Jing
AU  - Wang, Zifan
AU  - Tan, Qishuo
AU  - Cao, Jun
AU  - Ling, Xi
PY  - 2023
DO  - 10.1002/jrs.6577
UR  - https://www.osti.gov/biblio/2421711
ID  - 2421711
ER  -