TY  - RPRT
TI  - Characterization of Polyamide Thin Films by Atomic Force Microscopy
AU  - Sreedhar, Nurshaun
AU  - Welch, Brian C.
AU  - Bright, Victor M.
AU  - Roy, Abhishek
AU  - Paul, Mou
AU  - Greenberg, Alan R.
PY  - 2024
DO  - 10.1016/j.polymer.2024.127350
UR  - https://www.osti.gov/biblio/2427284
ID  - 2427284
ER  -