TY  - RPRT
TI  - Simple self-consistent method for excited states in density functional theory to characterize defect-derived behavior in wide-band-gap-based microelectronic materials
AU  - Schultz, Peter A.
AU  - Lutz, Jesse J.
PY  - 2024
DO  - 10.2172/2430318
UR  - https://www.osti.gov/biblio/2430318
ID  - 2430318
ER  -