TY  - RPRT
TI  - Gate insertions scale noise tractably for zero noise extrapolation on a trapped ion device
AU  - Maupin, Oliver
AU  - Love, Peter J.
AU  - Burch, Ashlyn Damaris
AU  - Landahl, Andrew J.
AU  - Clark, Susan M.
PY  - 2023
DO  - 10.2172/2431756
UR  - https://www.osti.gov/biblio/2431756
ID  - 2431756
ER  -