@misc{indiciaef8fbb2072880,
  title = {High-Throughput Microstructural Characterization and Process Correlation Using Automated Electron Backscatter Diffraction},
  author = {Fowler, J. Elliott and Ruggles, Timothy J. and Cillessen, Dale E. and Johnson, Kyle L. and Jauregui, Luis J. and Craig, Robert L. and Bianco, Nathan R. and Henriksen, Amelia A. and Boyce, Brad L.},
  year = {2024},
  doi = {10.1007/s40192-024-00366-2},
  url = {https://www.osti.gov/biblio/2439319},
  note = {Source identifier: 2439319}
}