TY  - RPRT
TI  - High-Throughput Microstructural Characterization and Process Correlation Using Automated Electron Backscatter Diffraction
AU  - Fowler, J. Elliott
AU  - Ruggles, Timothy J.
AU  - Cillessen, Dale E.
AU  - Johnson, Kyle L.
AU  - Jauregui, Luis J.
AU  - Craig, Robert L.
AU  - Bianco, Nathan R.
AU  - Henriksen, Amelia A.
AU  - Boyce, Brad L.
PY  - 2024
DO  - 10.1007/s40192-024-00366-2
UR  - https://www.osti.gov/biblio/2439319
ID  - 2439319
ER  -