TY  - RPRT
TI  - Modeling injection-induced fault slip using long short-term memory networks
AU  - Mital, Utkarsh
AU  - Hu, Mengsu
AU  - Guglielmi, Yves
AU  - Brown, James
AU  - Rutqvist, Jonny
PY  - 2024
DO  - 10.1016/j.jrmge.2024.09.006
UR  - https://www.osti.gov/biblio/2439800
ID  - 2439800
ER  -