TY  - RPRT
TI  - Technical basis for understanding the process-microstructure-property correlation in LPBF 316 SS
AU  - Zhang, Xuan
AU  - Gao, Lin
AU  - Mantri, Srinivas Aditya
PY  - 2024
DO  - 10.2172/2467450
UR  - https://www.osti.gov/biblio/2467450
ID  - 2467450
ER  -