TY  - RPRT
TI  - Structural, electronic, and optical-absorption properties of 2D Si thin films
AU  - Saunders, Nicholas
AU  - Palchoudhury, Soubantika
AU  - Jakowski, Jacek
AU  - Huang, Jingsong
PY  - 2024
DO  - 10.1557/s43579-024-00657-x
UR  - https://www.osti.gov/biblio/2468730
ID  - 2468730
ER  -