@misc{indiciaeb2a284acdc83,
  title = {Five-second STEM dislocation tomography for 300 nm thick specimen assisted by deep-learning-based noise filtering},
  author = {Zhao, Yifang and Koike, Suguru and Nakama, Rikuto and Ihara, Shiro and Mitsuhara, Masatoshi and Murayama, Mitsuhiro and Hata, Satoshi and Saito, Hikaru},
  year = {2021},
  doi = {10.1038/s41598-021-99914-5},
  url = {https://www.osti.gov/biblio/2471558},
  note = {Source identifier: 2471558}
}