TY  - RPRT
TI  - Five-second STEM dislocation tomography for 300 nm thick specimen assisted by deep-learning-based noise filtering
AU  - Zhao, Yifang
AU  - Koike, Suguru
AU  - Nakama, Rikuto
AU  - Ihara, Shiro
AU  - Mitsuhara, Masatoshi
AU  - Murayama, Mitsuhiro
AU  - Hata, Satoshi
AU  - Saito, Hikaru
PY  - 2021
DO  - 10.1038/s41598-021-99914-5
UR  - https://www.osti.gov/biblio/2471558
ID  - 2471558
ER  -